文献
J-GLOBAL ID:200902284836296591
整理番号:05A0657841
自己形成InNナノ構造の電界放出性質:Ga取込みの効果
Field emission properties of self-assembled InN nano-structures: Effect of Ga incorporation
著者 (4件):
SHIH C.f.
(Dep. of Material Sci. and Engineering, National Tsing-Hua Univ., Hsinchu, Taiwan, Republic of China)
,
CHEN N.c.
(Dep. of Electronic Engineering, Chang Gung Univ., 259 Wen-Hwa 1st Road, Tao-Yuan, Taiwan, Republic of China)
,
CHANG P.h.
(Dep. of Electronic Engineering, Chang Gung Univ., 259 Wen-Hwa 1st Road, Tao-Yuan, Taiwan, Republic of China)
,
LIU K.s.
(Dep. of Material Sci. and Engineering, National Tsing-Hua Univ., Hsinchu, Taiwan, Republic of China)
資料名:
Journal of Crystal Growth
(Journal of Crystal Growth)
巻:
281
号:
2-4
ページ:
328-333
発行年:
2005年08月01日
JST資料番号:
B0942A
ISSN:
0022-0248
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)