文献
J-GLOBAL ID:200902287253031505
整理番号:07A1233105
N面成長を利用した窒化物を基本とする高電子移動度トランジスターに関する固有抵抗の低いナノ合金Ohm性コンタクト
Low nonalloyed Ohmic contact resistance to nitride high electron mobility transistors using N-face growth
著者 (10件):
WONG Man Hoi
(Dep. of Electrical and Computer Engineering and Materials Dep., Univ. of California, Santa Barbara, California 93106 ...)
,
PEI Yi
(Dep. of Electrical and Computer Engineering and Materials Dep., Univ. of California, Santa Barbara, California 93106 ...)
,
PALACIOS Tomas
(Dep. of Electrical and Computer Engineering and Materials Dep., Univ. of California, Santa Barbara, California 93106 ...)
,
SHEN Likun
(Dep. of Electrical and Computer Engineering and Materials Dep., Univ. of California, Santa Barbara, California 93106 ...)
,
CHAKRABORTY Arpan
(Dep. of Electrical and Computer Engineering and Materials Dep., Univ. of California, Santa Barbara, California 93106 ...)
,
MCCARTHY Lee S.
(Dep. of Electrical and Computer Engineering and Materials Dep., Univ. of California, Santa Barbara, California 93106 ...)
,
KELLER Stacia
(Dep. of Electrical and Computer Engineering and Materials Dep., Univ. of California, Santa Barbara, California 93106 ...)
,
DENBAARS Steven P.
(Dep. of Electrical and Computer Engineering and Materials Dep., Univ. of California, Santa Barbara, California 93106 ...)
,
SPECK James S.
(Dep. of Electrical and Computer Engineering and Materials Dep., Univ. of California, Santa Barbara, California 93106 ...)
,
MISHRA Umesh K.
(Dep. of Electrical and Computer Engineering and Materials Dep., Univ. of California, Santa Barbara, California 93106 ...)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
91
号:
23
ページ:
232103-232103-3
発行年:
2007年12月03日
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)