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J-GLOBAL ID：201002208471545808 整理番号：10A0325948

GaAs/GaAsP超格子のX線回折により決定した歪

Strain of GaAs/GaAsP Superlattices Used as Spin-Polarized Electron Photocathodes, Determined by X-Ray Diffraction

著者 (24件)：

SAKA Takashi

(Dep. of Electrical and Electronic Engineering, School of Engineering, Daido Univ., JPN)

ISHIDA Yoichi

(Dep. of Electrical and Electronic Engineering, School of Engineering, Daido Univ., JPN)

KANDA Masataka

(Dep. of Electrical and Electronic Engineering, School of Engineering, Daido Univ., JPN)

JIN Xiuguang

(Dep. of Crystalline Materials Sci., Graduate School of Engineering, Nagoya Univ., JPN)

MAEDA Yuya

(Dep. of Crystalline Materials Sci., Graduate School of Engineering, Nagoya Univ., JPN)

FUCHI Shingo

(Dep. of Crystalline Materials Sci., Graduate School of Engineering, Nagoya Univ., JPN)

UJIHARA Toru

(Dep. of Crystalline Materials Sci., Graduate School of Engineering, Nagoya Univ., JPN)

TAKEDA Yoshikazu

(Dep. of Crystalline Materials Sci., Graduate School of Engineering, Nagoya Univ., JPN)

MATSUYAMA Tetsuya

(Dep. of Physics and Electronics, Graduate School of Engineering, Osaka Prefecture Univ., JPN)

HORINAKA Hiromichi

(Dep. of Physics and Electronics, Graduate School of Engineering, Osaka Prefecture Univ., JPN)

KATO Toshihiro

(New Business Dev. Div., Daido Steel Co., Ltd., JPN)

YAMAMOTO Naoto

(Graduate School of Engineering, Nagoya Univ., JPN)

MANO Atsushi