文献
J-GLOBAL ID:201002273726615771
整理番号:10A0780895
極低温におけるシングルイベント効果を特性評価するための新しいテストシステムの応用
Application of a novel test system to characterize single-event effects at cryogenic temperatures
著者 (15件):
RAMACHANDRAN Vishwanath
(Dep. of Electrical Engineering and Computer Sci., Vanderbilt Univ., Nashville TN, USA)
,
GADLAGE Matthew J.
(Dep. of Electrical Engineering and Computer Sci., Vanderbilt Univ., Nashville TN, USA)
,
AHLBIN Jonathan R.
(Dep. of Electrical Engineering and Computer Sci., Vanderbilt Univ., Nashville TN, USA)
,
NARASIMHAM Balaji
(Broadcom Corp., Irvine, CA, USA)
,
ALLES Michael L.
(Dep. of Electrical Engineering and Computer Sci., Vanderbilt Univ., Nashville TN, USA)
,
ALLES Michael L.
(Inst. for Space and Defense Electronics (ISDE), Vanderbilt Univ., Nashville TN, USA)
,
REED Robert A.
(Dep. of Electrical Engineering and Computer Sci., Vanderbilt Univ., Nashville TN, USA)
,
REED Robert A.
(Inst. for Space and Defense Electronics (ISDE), Vanderbilt Univ., Nashville TN, USA)
,
BHUVA Bharat L.
(Dep. of Electrical Engineering and Computer Sci., Vanderbilt Univ., Nashville TN, USA)
,
BHUVA Bharat L.
(Inst. for Space and Defense Electronics (ISDE), Vanderbilt Univ., Nashville TN, USA)
,
MASSENGILL Lloyd W.
(Dep. of Electrical Engineering and Computer Sci., Vanderbilt Univ., Nashville TN, USA)
,
MASSENGILL Lloyd W.
(Inst. for Space and Defense Electronics (ISDE), Vanderbilt Univ., Nashville TN, USA)
,
BLACK Jeffrey D.
(Dep. of Electrical Engineering and Computer Sci., Vanderbilt Univ., Nashville TN, USA)
,
BLACK Jeffrey D.
(Inst. for Space and Defense Electronics (ISDE), Vanderbilt Univ., Nashville TN, USA)
,
FOSTER Christopher N.
(IR Labs Inc. Tucson, AZ, USA)
資料名:
Solid-State Electronics
(Solid-State Electronics)
巻:
54
号:
10
ページ:
1052-1059
発行年:
2010年10月
JST資料番号:
H0225A
ISSN:
0038-1101
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)