文献
J-GLOBAL ID:201002285176786822
整理番号:10A0664865
結晶性Siの負荷速度依存性のナノインデンテーション研究における非晶質化の直接観察
Direct observation of amophization in load rate dependent nanoindentation studies of crystalline Si
著者 (11件):
DAS C. R.
(Materials Technol. Div., Indira Gandhi Centre for Atomic Res., Kalpakkam 603102, IND)
,
DHARA S.
(Surface and Nanoscience Div., Indira Gandhi Centre for Atomic Res., Kalpakkam 603102, IND)
,
JENG Yeau-ren
(Dep. of Mechanical Engineering, National Chung Cheng Univ., Chia-Yi 62102, Taiwan)
,
TSAI Ping-chi
(Dep. of Mechanical Engineering, National Chung Cheng Univ., Chia-Yi 62102, Taiwan)
,
HSU H. C.
(Inst. of Electro-Optical Sci. and Engineering, National Cheng Kung Univ., Tainan 70101, Taiwan)
,
RAJ Baldev
(Materials Technol. Div., Indira Gandhi Centre for Atomic Res., Kalpakkam 603102, IND)
,
BHADURI A. K.
(Materials Technol. Div., Indira Gandhi Centre for Atomic Res., Kalpakkam 603102, IND)
,
ALBERT S. K.
(Materials Technol. Div., Indira Gandhi Centre for Atomic Res., Kalpakkam 603102, IND)
,
TYAGI A. K.
(Surface and Nanoscience Div., Indira Gandhi Centre for Atomic Res., Kalpakkam 603102, IND)
,
CHEN L. C.
(Center for Condensed Matter Sciences, National Taiwan Univ., Taipei 106, Taiwan)
,
CHEN K. H.
(Center for Condensed Matter Sciences, National Taiwan Univ., Taipei 106, Taiwan)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
96
号:
25
ページ:
253113
発行年:
2010年06月21日
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)