文献
J-GLOBAL ID:201102225070185077
整理番号:11A0966810
二反射発散微分臨界角屈折率計
A two-reflection divergent differentiating critical angle refractometer
著者 (5件):
GUO Wenping
(Wuhan National Lab. for Optoelectronics, Coll. of Optoelectronic Sci. and Engineering, Huazhong Univ. of Sci. and ...)
,
XIA Min
(Wuhan National Lab. for Optoelectronics, Coll. of Optoelectronic Sci. and Engineering, Huazhong Univ. of Sci. and ...)
,
LI Wei
(Wuhan National Lab. for Optoelectronics, Coll. of Optoelectronic Sci. and Engineering, Huazhong Univ. of Sci. and ...)
,
DAI Jie
(Wuhan National Lab. for Optoelectronics, Coll. of Optoelectronic Sci. and Engineering, Huazhong Univ. of Sci. and ...)
,
YANG Kecheng
(Wuhan National Lab. for Optoelectronics, Coll. of Optoelectronic Sci. and Engineering, Huazhong Univ. of Sci. and ...)
資料名:
Review of Scientific Instruments
(Review of Scientific Instruments)
巻:
82
号:
5
ページ:
053108
発行年:
2011年05月
JST資料番号:
D0517A
ISSN:
0034-6748
CODEN:
RSINAK
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)