文献
J-GLOBAL ID:201202227765881783
整理番号:12A1718493
電子線後方散乱回折法で代表集合組織を得るための最小走査寸法の決定
Determination of the Minimum Scan Size to Obtain Representative Textures by Electron Backscatter Diffraction
著者 (4件):
BRAHME Abhijit
(Univ. of Waterloo, Dep. of Mechanical and Mechatronics Engineering, 200 Univ. Ave. W, N2L 3G1, Waterloo, ON, CAN)
,
STARASELSKI Yauheni
(Univ. of Waterloo, Dep. of Mechanical and Mechatronics Engineering, 200 Univ. Ave. W, N2L 3G1, Waterloo, ON, CAN)
,
INAL Kaan
(Univ. of Waterloo, Dep. of Mechanical and Mechatronics Engineering, 200 Univ. Ave. W, N2L 3G1, Waterloo, ON, CAN)
,
MISHRA Raja K.
(General Motors Res. and Dev. Center, 3500 Mound Rd., 48090-9055, Warren, MI, USA)
資料名:
Metallurgical and Materials Transactions. A. Physical Metallurgy and Materials Science
(Metallurgical and Materials Transactions. A. Physical Metallurgy and Materials Science)
巻:
43
号:
13
ページ:
5298-5307
発行年:
2012年12月
JST資料番号:
E0265B
ISSN:
1073-5623
CODEN:
MTTABN
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)