文献
J-GLOBAL ID:201202244267946853
整理番号:12A0363832
シリコン表面のCF3+エッチング:分子動力学的研究
CF3 + etching silicon surface: A molecular dynamics study
著者 (11件):
ZHAO C.
(Inst. of Plasma Surface Interactions, Guizhou Univ., Guiyang 550025, CHN)
,
ZHAO C.
(Coll. of Sci., Guizhou Univ., Guiyang 550025, CHN)
,
LU X.
(Inst. of Plasma Surface Interactions, Guizhou Univ., Guiyang 550025, CHN)
,
HE P.
(Inst. of Plasma Surface Interactions, Guizhou Univ., Guiyang 550025, CHN)
,
ZHANG P.
(Inst. of Plasma Surface Interactions, Guizhou Univ., Guiyang 550025, CHN)
,
SUN W.
(Key Lab of Radiation Physics & Technol. Ministry of Education, Chengdu 610064, CHN)
,
ZHANG J.
(Key Lab of Radiation Physics & Technol. Ministry of Education, Chengdu 610064, CHN)
,
CHEN F.
(Inst. of Plasma Surface Interactions, Guizhou Univ., Guiyang 550025, CHN)
,
CHEN F.
(Coll. of Sci., Guizhou Univ., Guiyang 550025, CHN)
,
GOU F.
(FOM Inst. for Plasma Physics, 3439 MN Nieuwegein, NLD)
,
GOU F.
(Key Lab of Radiation Physics & Technol. Ministry of Education, Chengdu 610064, CHN)
資料名:
Vacuum
(Vacuum)
巻:
86
号:
7
ページ:
913-916
発行年:
2012年02月08日
JST資料番号:
E0347A
ISSN:
0042-207X
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)