文献
J-GLOBAL ID:201202251524160293
整理番号:12A1547926
RF/アナログSoC用の高性能32nm HKMG SOI CMOS最先端モデリングおよび最適化
Advanced modeling and optimization of high performance 32nm HKMG SOI CMOS
著者 (32件):
LEE S.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
JOHNSON J.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
GREENE B.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
CHOU A.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
ZHAO K.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
CHOWDHURY M.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
SIM J.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
KUMAR A.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
KIM D.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
SUTTON A.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
KU S.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
LIANG Y.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
WANG Y.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
SLISHER D.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
DUNCAN K.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
HYDE P.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
THOMA R.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
DENG J.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
DENG Y.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
RUPANI R.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
WILLIAMS R.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
WAGNER L.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
WERMER C.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
LI H.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
JOHNSON B.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
DALEY D.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
PLOUCHART J. O.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
NARASIMHA S.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
PUTNAM C.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
MACIEJEWSKI E.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
HENSON W.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
,
SPRINGER S.
(IBM Semiconductor Res. and Dev. Center, VT, USA)
資料名:
Digest of Technical Papers. Symposium on VLSI Technology
(Digest of Technical Papers. Symposium on VLSI Technology)
巻:
2012
ページ:
135-136
発行年:
2012年
JST資料番号:
A0035B
ISSN:
0743-1562
資料種別:
会議録 (C)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)