文献
J-GLOBAL ID:201202261859010852
整理番号:12A1371099
高分解能X線回折によるInAs/GaSb超格子構造特性に関する研究
Studies on InAs/GaSb superlattice structural properties by high resolution x-ray diffraction
著者 (4件):
ZHOU Yi
(Key Lab. of Infrared Imaging Material and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
,
CHEN Jianxin
(Key Lab. of Infrared Imaging Material and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
,
XU Qingqing
(Key Lab. of Infrared Imaging Material and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
,
HE Li
(Key Lab. of Infrared Imaging Material and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
資料名:
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
(Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena)
巻:
30
号:
5
ページ:
051203-051203-6
発行年:
2012年09月
JST資料番号:
E0974A
ISSN:
2166-2746
CODEN:
JVTBD9
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)