文献
J-GLOBAL ID:201202266351077198
整理番号:12A1053325
GaAs-GaAsP歪超格子光電陰極の30kVスピン分極透過型電子顕微鏡
30-kV spin-polarized transmission electron microscope with GaAs-GaAsP strained superlattice photocathode
著者 (9件):
KUWAHARA M.
(EcoTopia Sci. Inst., Nagoya Univ., Nagoya 464-8603, JPN)
,
KUSUNOKI S.
(Graduate School of Engineering, Nagoya Univ., Nagoya 464-8603, JPN)
,
JIN X. G.
(Graduate School of Engineering, Nagoya Univ., Nagoya 464-8603, JPN)
,
NAKANISHI T.
(Graduate School of Sci., Nagoya Univ., Nagoya 464-8602, JPN)
,
TAKEDA Y.
(Graduate School of Engineering, Nagoya Univ., Nagoya 464-8603, JPN)
,
SAITOH K.
(EcoTopia Sci. Inst., Nagoya Univ., Nagoya 464-8603, JPN)
,
UJIHARA T.
(Graduate School of Engineering, Nagoya Univ., Nagoya 464-8603, JPN)
,
ASANO H.
(Graduate School of Engineering, Nagoya Univ., Nagoya 464-8603, JPN)
,
TANAKA N.
(EcoTopia Sci. Inst., Nagoya Univ., Nagoya 464-8603, JPN)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
101
号:
3
ページ:
033102-033102-4
発行年:
2012年07月16日
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)