文献
J-GLOBAL ID:201202295569478674
整理番号:12A1336952
時間分解透過型電子顕微鏡による中間強誘電体スイッチング領域へのアクセス
Accessing intermediate ferroelectric switching regimes with time-resolved transmission electron microscopy
著者 (6件):
WINKLER Christopher R.
(Dep. of Materials Sci. & Engineering, Drexel Univ., Philadelphia, Pennsylvania 19104, USA)
,
JABLONSKI Michael L.
(Dep. of Materials Sci. & Engineering, Drexel Univ., Philadelphia, Pennsylvania 19104, USA)
,
DAMODARAN Anoop R.
(Dep. of Materials Sci. & Engineering and Materials Res. Lab., Univ. of Illinois, Urbana-Champaign, Illinois 61820, USA)
,
JAMBUNATHAN Karthik
(Dep. of Materials Sci. & Engineering and Materials Res. Lab., Univ. of Illinois, Urbana-Champaign, Illinois 61820, USA)
,
MARTIN Lane W.
(Dep. of Materials Sci. & Engineering and Materials Res. Lab., Univ. of Illinois, Urbana-Champaign, Illinois 61820, USA)
,
TAHERI Mitra L.
(Dep. of Materials Sci. & Engineering, Drexel Univ., Philadelphia, Pennsylvania 19104, USA)
資料名:
Journal of Applied Physics
(Journal of Applied Physics)
巻:
112
号:
5
ページ:
052013-052013-7
発行年:
2012年09月01日
JST資料番号:
C0266A
ISSN:
0021-8979
CODEN:
JAPIAU
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)