文献
J-GLOBAL ID:201302269965031514
整理番号:13A0148569
ヘテロ接合界面エネルギーのXPS定量化
XPS quantification of the hetero-junction interface energy
著者 (10件):
MA Z.s.
(Key Lab. of Low-Dimensional Materials and Application Technol. of Ministry of Education, Inst. for Quantum ...)
,
WANG Yan
(Key Lab. of Low-Dimensional Materials and Application Technol. of Ministry of Education, Inst. for Quantum ...)
,
WANG Yan
(School of Information and Electronic Engineering, Hunan Univ. of Sci. and Technol., Hunan 411201, CHN)
,
HUANG Y.l.
(Key Lab. of Low-Dimensional Materials and Application Technol. of Ministry of Education, Inst. for Quantum ...)
,
ZHOU Z.f.
(Key Lab. of Low-Dimensional Materials and Application Technol. of Ministry of Education, Inst. for Quantum ...)
,
ZHOU Y.c.
(Key Lab. of Low-Dimensional Materials and Application Technol. of Ministry of Education, Inst. for Quantum ...)
,
ZHENG Weitao
(School of Materials Sci., Jilin Univ., Changchun 130012, CHN)
,
SUN Chang Q.
(Key Lab. of Low-Dimensional Materials and Application Technol. of Ministry of Education, Inst. for Quantum ...)
,
SUN Chang Q.
(School of Materials Sci., Jilin Univ., Changchun 130012, CHN)
,
SUN Chang Q.
(School of Electrical and Electronic Engineering, Nanyang Technological Univ., Singapore 639798, SGP)
資料名:
Applied Surface Science
(Applied Surface Science)
巻:
265
ページ:
71-77
発行年:
2013年01月15日
JST資料番号:
B0707B
ISSN:
0169-4332
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)