文献
J-GLOBAL ID:201302272379296275
整理番号:13A1229043
光学及びX線法によるZnO構造の評価
Characterization of ZnO structures by optical and X-ray methods
著者 (12件):
PETRIK P.
(Fraunhofer Inst. for Integrated Systems and Device Technol., Schottkystrasse 10, 91058 Erlangen, DEU)
,
PETRIK P.
(Inst. for Technical Physics and Materials Sci. (MFA), Res. Center for Natural Sciences, Konkoly Thege Rd. 29-33 ...)
,
POLLAKOWSKI B.
(Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, DEU)
,
ZAKEL S.
(Physikalisch-Technische Bundesanstalt (PTB), Bundesallee 100, D-38116 Braunschweig, DEU)
,
GUMPRECHT T.
(Fraunhofer Inst. for Integrated Systems and Device Technol., Schottkystrasse 10, 91058 Erlangen, DEU)
,
GUMPRECHT T.
(Erlangen Graduate School in Advanced Optical Technologies (SAOT), Paul-Gordan-Strasse 9, 91052 Erlangen, DEU)
,
BECKHOFF B.
(Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, DEU)
,
LEMBERGER M.
(Fraunhofer Inst. for Integrated Systems and Device Technol., Schottkystrasse 10, 91058 Erlangen, DEU)
,
LABADI Z.
(Inst. for Technical Physics and Materials Sci. (MFA), Res. Center for Natural Sciences, Konkoly Thege Rd. 29-33 ...)
,
BAJI Z.
(Inst. for Technical Physics and Materials Sci. (MFA), Res. Center for Natural Sciences, Konkoly Thege Rd. 29-33 ...)
,
JANK M.
(Fraunhofer Inst. for Integrated Systems and Device Technol., Schottkystrasse 10, 91058 Erlangen, DEU)
,
NUTSCH A.
(Physikalisch-Technische Bundesanstalt (PTB), Abbestr. 2-12, 10587 Berlin, DEU)
資料名:
Applied Surface Science
(Applied Surface Science)
巻:
281
ページ:
123-128
発行年:
2013年09月15日
JST資料番号:
B0707B
ISSN:
0169-4332
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)