文献
J-GLOBAL ID:201302283264878906
整理番号:13A1697975
HgCdTe層中の転位を記述するSchaakeエッチとBensonエッチの比較
Comparison of the Schaake and Benson Etches to Delineate Dislocations in HgCdTe Layers
著者 (8件):
FARRELL S.
(George Mason Univ., Dep. of Electrical and Computer Engineering, 22030-4444, Fairfax, VA, USA)
,
RAO Mulpuri V.
(George Mason Univ., Dep. of Electrical and Computer Engineering, 22030-4444, Fairfax, VA, USA)
,
BRILL G.
(Sensors and Electron Devices Directorate, U.S. Army Res. Lab., 2800 Powder Mill Road, 20783, Adelphi, MD, USA)
,
CHEN Y.
(Sensors and Electron Devices Directorate, U.S. Army Res. Lab., 2800 Powder Mill Road, 20783, Adelphi, MD, USA)
,
WIJEWARNASURIYA P.
(Sensors and Electron Devices Directorate, U.S. Army Res. Lab., 2800 Powder Mill Road, 20783, Adelphi, MD, USA)
,
DHAR N.
(Sensors and Electron Devices Directorate, U.S. Army Res. Lab., 2800 Powder Mill Road, 20783, Adelphi, MD, USA)
,
BENSON J. D.
(U.S. Army RDECOM CERDEC Night Vision and Electronic Sensors Directorate, Ft. Belvoir, VA, USA)
,
HARRIS K.
(Penn State Electro-Optics Center, 222 Northpointe Blvd., 16229, Freeport, PA, USA)
資料名:
Journal of Electronic Materials
(Journal of Electronic Materials)
巻:
42
号:
11
ページ:
3097-3102
発行年:
2013年11月
JST資料番号:
D0277B
ISSN:
0361-5235
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)