文献
J-GLOBAL ID:201302291109234426
整理番号:13A1271952
暗視野光学顕微鏡による化学蒸着グラフェンの非破壊的な高速評価
Non-destructive and rapid evaluation of chemical vapor deposition graphene by dark field optical microscopy
著者 (9件):
KONG X. H.
(Dep. of Mechanical Engineering and the Materials Sci. and Engineering Program, The Univ. of Texas at Austin, 1 Univ. ...)
,
JI H. X.
(Dep. of Mechanical Engineering and the Materials Sci. and Engineering Program, The Univ. of Texas at Austin, 1 Univ. ...)
,
PINER R. D.
(Dep. of Mechanical Engineering and the Materials Sci. and Engineering Program, The Univ. of Texas at Austin, 1 Univ. ...)
,
LI H. F.
(Dep. of Mechanical Engineering and the Materials Sci. and Engineering Program, The Univ. of Texas at Austin, 1 Univ. ...)
,
MAGNUSON C. W.
(Dep. of Mechanical Engineering and the Materials Sci. and Engineering Program, The Univ. of Texas at Austin, 1 Univ. ...)
,
TAN C.
(Dep. of Mechanical Engineering and the Materials Sci. and Engineering Program, The Univ. of Texas at Austin, 1 Univ. ...)
,
ISMACH A.
(Dep. of Mechanical Engineering and the Materials Sci. and Engineering Program, The Univ. of Texas at Austin, 1 Univ. ...)
,
CHOU H.
(Dep. of Mechanical Engineering and the Materials Sci. and Engineering Program, The Univ. of Texas at Austin, 1 Univ. ...)
,
RUOFF R. S.
(Dep. of Mechanical Engineering and the Materials Sci. and Engineering Program, The Univ. of Texas at Austin, 1 Univ. ...)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
103
号:
4
ページ:
043119-043119-4
発行年:
2013年07月22日
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)