文献
J-GLOBAL ID:201402267044356412
整理番号:14A0007999
拡張波長InxGa1-xAs/InP光検出器における深い準位トラップ誘起暗電流
Deep-level traps induced dark currents in extended wavelength InxGa1-xAs/InP photodetector
著者 (10件):
JI Xiaoli
(School of Electronics Sci. and Engineering, Nanjing Univ., Nanjing 210093, CHN)
,
LIU Baiqing
(School of Electronics Sci. and Engineering, Nanjing Univ., Nanjing 210093, CHN)
,
XU Yue
(School of Electronics Sci. and Engineering, Nanjing Univ., Nanjing 210093, CHN)
,
TANG Hengjing
(State Key Lab. of Transducer Technol., Shanghai Inst. of Technical Physics, Shanghai 200083, CHN)
,
LI Xue
(State Key Lab. of Transducer Technol., Shanghai Inst. of Technical Physics, Shanghai 200083, CHN)
,
GONG Haimei
(State Key Lab. of Transducer Technol., Shanghai Inst. of Technical Physics, Shanghai 200083, CHN)
,
SHEN Bo
(Physics Dep., Peking Univ., Beijing 100871, CHN)
,
YANG Xuelin
(Physics Dep., Peking Univ., Beijing 100871, CHN)
,
HAN Ping
(School of Electronics Sci. and Engineering, Nanjing Univ., Nanjing 210093, CHN)
,
YAN Feng
(School of Electronics Sci. and Engineering, Nanjing Univ., Nanjing 210093, CHN)
資料名:
Journal of Applied Physics
(Journal of Applied Physics)
巻:
114
号:
22
ページ:
224502-224502-5
発行年:
2013年12月14日
JST資料番号:
C0266A
ISSN:
0021-8979
CODEN:
JAPIAU
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)