文献
J-GLOBAL ID:201502207350457198
整理番号:15A1215777
THz InPベースPHEMT応用のためのオンウエハ較正の比較【Powered by NICT】
Comparison of on-wafer calibrations for THz InP-based PHEMTs applications
著者 (9件):
Wang Zhiming
(Beijing Inst. of Technol. Beijing Key Lab. of Millimeter Wave and Terahertz Technol., Beijing)
,
Huang Hui
(National Inst. of Metrology, Beijing)
,
Hu Zhifu
(Hebei Semiconductor Res. Inst., Shijiazhuang)
,
Zhao Zhuobin
(Beijing Inst. of Technol. Beijing Key Lab. of Millimeter Wave and Terahertz Technol., Beijing)
,
Wang Xudong
(Beijing Inst. of Technol. Beijing Key Lab. of Millimeter Wave and Terahertz Technol., Beijing)
,
Luo Xiaobin
(Beijing Inst. of Technol. Beijing Key Lab. of Millimeter Wave and Terahertz Technol., Beijing)
,
Liu Jun
(Beijing Inst. of Technol. Beijing Key Lab. of Millimeter Wave and Terahertz Technol., Beijing)
,
Yang Songyuan
(Beijing Inst. of Technol. Beijing Key Lab. of Millimeter Wave and Terahertz Technol., Beijing)
,
Lu Xin
(Beijing Inst. of Technol. Beijing Key Lab. of Millimeter Wave and Terahertz Technol., Beijing)
資料名:
Journal of Semiconductors
(Journal of Semiconductors)
巻:
36
号:
6
ページ:
064006-01-064006-04
発行年:
2015年
JST資料番号:
C2377A
ISSN:
1674-4926
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
中国 (CHN)
言語:
英語 (EN)