文献
J-GLOBAL ID:201502213923169060
整理番号:15A0446965
電界放出誘起エレクトロマイグレーションを用いた懸垂Niナノギャップのトンネル抵抗の制御
Controlling the tunnel resistance of suspended Ni nanogaps using field-emission-induced electromigration
著者 (5件):
TOYONAKA Takahiro
(Dep. of Electrical and Electronic Engineering, Tokyo Univ. of Agriculture and Technol., 2-24-16 Nakacho, Koganei ...)
,
MORIHARA Kohei
(Dep. of Electrical and Electronic Engineering, Tokyo Univ. of Agriculture and Technol., 2-24-16 Nakacho, Koganei ...)
,
TAKIKAWA Kazuki
(Dep. of Electrical and Electronic Engineering, Tokyo Univ. of Agriculture and Technol., 2-24-16 Nakacho, Koganei ...)
,
ITO Mitsuki
(Dep. of Electrical and Electronic Engineering, Tokyo Univ. of Agriculture and Technol., 2-24-16 Nakacho, Koganei ...)
,
SHIRAKASHI Jun-ichi
(Dep. of Electrical and Electronic Engineering, Tokyo Univ. of Agriculture and Technol., 2-24-16 Nakacho, Koganei ...)
資料名:
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
(Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena)
巻:
33
号:
2
ページ:
02B107-02B107-4
発行年:
2015年03月
JST資料番号:
E0974A
ISSN:
2166-2746
CODEN:
JVTBD9
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)