文献
J-GLOBAL ID:201502220438215891
整理番号:15A0804294
高エネルギー集束ガリウムイオンビームにより彫刻したグラフェンの横方向損傷
Lateral damage in graphene carved by high energy focused gallium ion beams
著者 (8件):
LIAO Zhongquan
(Fraunhofer Inst. for Ceramic Technologies and Systems (IKTS), Maria-Reiche-Strasse 2, 01109 Dresden, DEU)
,
ZHANG Tao
(Professur fuer Makromolekulare Chemie, Dep. Chemie, Technische Universitaet Dresden, Mommsenstrasse 4, 01069 Dresden ...)
,
GALL Martin
(Fraunhofer Inst. for Ceramic Technologies and Systems (IKTS), Maria-Reiche-Strasse 2, 01109 Dresden, DEU)
,
DIANAT Arezoo
(Inst. for Materials Sci. and Max Bergmann Center of Biomaterials, Technische Universitaet Dresden, Hallwachsstrasse ...)
,
ROSENKRANZ Ruediger
(Fraunhofer Inst. for Ceramic Technologies and Systems (IKTS), Maria-Reiche-Strasse 2, 01109 Dresden, DEU)
,
JORDAN Rainer
(Professur fuer Makromolekulare Chemie, Dep. Chemie, Technische Universitaet Dresden, Mommsenstrasse 4, 01069 Dresden ...)
,
CUNIBERTI Gianaurelio
(Inst. for Materials Sci. and Max Bergmann Center of Biomaterials, Technische Universitaet Dresden, Hallwachsstrasse ...)
,
ZSCHECH Ehrenfried
(Fraunhofer Inst. for Ceramic Technologies and Systems (IKTS), Maria-Reiche-Strasse 2, 01109 Dresden, DEU)
資料名:
Applied Physics Letters
(Applied Physics Letters)
巻:
107
号:
1
ページ:
013108-013108-5
発行年:
2015年07月06日
JST資料番号:
H0613A
ISSN:
0003-6951
CODEN:
APPLAB
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)