文献
J-GLOBAL ID:201502221467213861
整理番号:15A1021631
ゲート誘電体としてグアニンを使うFETの潜在的応用におけるグラフェンベースのテストプラットフォーム
Graphene-based Test Platform in Potential Application for FET with Guanine as Gate Dielectric
著者 (13件):
WILLIAMS Adrienne D.
(Wright-Patterson, AFB, Materials and Manufacturing Directorate, Air Force Res. Lab., 45433, Fairborn, OH, USA)
,
WILLIAMS Adrienne D.
(Wright State Univ., Dep. of Physics, 45435, Dayton, OH, USA)
,
OUCHEN Fahima
(Wright-Patterson, AFB, Materials and Manufacturing Directorate, Air Force Res. Lab., 45433, Fairborn, OH, USA)
,
KIM Steve S.
(Wright-Patterson, AFB, Materials and Manufacturing Directorate, Air Force Res. Lab., 45433, Fairborn, OH, USA)
,
NGO Yen H.
(Wright-Patterson, AFB, Materials and Manufacturing Directorate, Air Force Res. Lab., 45433, Fairborn, OH, USA)
,
ELHAMRI Said
(Univ. of Dayton, Dep. of Physics, 45469, Dayton, OH, USA)
,
SIWECKI Arthur
(Univ. of Dayton, Dep. of Physics, 45469, Dayton, OH, USA)
,
MOU Shin
(Wright-Patterson, AFB, Materials and Manufacturing Directorate, Air Force Res. Lab., 45433, Fairborn, OH, USA)
,
CAMPO Eva M.
(Univ. of Bangor, School of Electronic Engineering, LL57 1UT, Bangor, Wales, GBR)
,
CAMPO Eva M.
(Univ. of Texas at San Antonio, Dep. of Physics and Astronomy, 78249, San Antonio, TX, USA)
,
KOZLOWSKI Gregory
(Wright State Univ., Dep. of Physics, 45435, Dayton, OH, USA)
,
NAIK Rajesh R.
(Wright-Patterson, AFB, Materials and Manufacturing Directorate, Air Force Res. Lab., 45433, Fairborn, OH, USA)
,
GROTE James
(Wright-Patterson, AFB, Materials and Manufacturing Directorate, Air Force Res. Lab., 45433, Fairborn, OH, USA)
資料名:
Journal of Electronic Materials
(Journal of Electronic Materials)
巻:
44
号:
10
ページ:
3481-3485
発行年:
2015年10月
JST資料番号:
D0277B
ISSN:
0361-5235
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)