文献
J-GLOBAL ID:201502224270161388
整理番号:15A0446973
ナノメータスケールにおける熱中性子ソフトエラー率の成因分析
Origin analysis of thermal neutron soft error rate at nanometer scale
著者 (9件):
YAMAZAKI Takashi
(Product & System Engineering Laboratories, Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-0197, JPN)
,
KATO Takashi
(Reliability Engineering Dep., Fujitsu Semiconductor Ltd., 50 Fuchigami, Akiruno 197-0833, JPN)
,
UEMURA Taiki
(Reliability Engineering Dep., Fujitsu Semiconductor Ltd., 50 Fuchigami, Akiruno 197-0833, JPN)
,
MATSUYAMA Hideya
(Reliability Engineering Dep., Fujitsu Semiconductor Ltd., 50 Fuchigami, Akiruno 197-0833, JPN)
,
TADA Yoko
(Product & System Engineering Laboratories, Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-0197, JPN)
,
YAMAZAKI Kazutoshi
(Devices & Materials Laboratories, Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-0197, JPN)
,
SOEDA Takeshi
(Product & System Engineering Laboratories, Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-0197, JPN)
,
MIYAJIMA Toyoo
(Product & System Engineering Laboratories, Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-0197, JPN)
,
KATAOKA Yuji
(Product & System Engineering Laboratories, Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-0197, JPN)
資料名:
Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
(Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena)
巻:
33
号:
2
ページ:
020604-020604-4
発行年:
2015年03月
JST資料番号:
E0974A
ISSN:
2166-2746
CODEN:
JVTBD9
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)