文献
J-GLOBAL ID:201502230702741119
整理番号:15A0564655
マグネトロンスパッタリングにより堆積したアモルファスZr-Ni-Sn薄膜の熱電特性
Thermoelectric Properties of Amorphous Zr-Ni-Sn Thin Films Deposited by Magnetron Sputtering
著者 (7件):
ZHOU Yang
(Tsinghua Univ., State Key Lab. of New Ceramics and Fine Processing, School of Materials Sci. and Engineering, 100084 ...)
,
TAN Qing
(Tsinghua Univ., State Key Lab. of New Ceramics and Fine Processing, School of Materials Sci. and Engineering, 100084 ...)
,
ZHU Jie
(Chinese Acad. of Sciences, Inst. of Engineering Thermophysics, 100190, Beijing, People’s Republic of China)
,
LI Siyang
(Tsinghua Univ., State Key Lab. of New Ceramics and Fine Processing, School of Materials Sci. and Engineering, 100084 ...)
,
LIU Chenjin
(Tsinghua Univ., State Key Lab. of New Ceramics and Fine Processing, School of Materials Sci. and Engineering, 100084 ...)
,
LEI Yuxiong
(Tsinghua Univ., State Key Lab. of New Ceramics and Fine Processing, School of Materials Sci. and Engineering, 100084 ...)
,
LI Liangliang
(Tsinghua Univ., State Key Lab. of New Ceramics and Fine Processing, School of Materials Sci. and Engineering, 100084 ...)
資料名:
Journal of Electronic Materials
(Journal of Electronic Materials)
巻:
44
号:
6
ページ:
1957-1962
発行年:
2015年06月
JST資料番号:
D0277B
ISSN:
0361-5235
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)