文献
J-GLOBAL ID:201502246957694975
整理番号:15A0263636
低温走査型トンネル顕微鏡像におけるSi(100)-2×1-H二量体列対比逆転
Si(100)-2×1-H dimer rows contrast inversion in low-temperature scanning tunneling microscope images
著者 (13件):
YAP T.L.
(Inst. Materials Res. and Engineering(IMRE), Agency for Sci., Technol. and Res.(A*STAR), Singapore, SGP)
,
YAP T.L.
(National Univ. Singapore, Singapore, SGP)
,
YAP T.L.
(GLOBALFOUNDRIES Singapore Pte Ltd, Singapore, SGP)
,
KAWAI H.
(Inst. Materials Res. and Engineering(IMRE), Agency for Sci., Technol. and Res.(A*STAR), Singapore, SGP)
,
NEUCHEVA O.A.
(Inst. Materials Res. and Engineering(IMRE), Agency for Sci., Technol. and Res.(A*STAR), Singapore, SGP)
,
WEE A.T.S.
(Inst. Materials Res. and Engineering(IMRE), Agency for Sci., Technol. and Res.(A*STAR), Singapore, SGP)
,
WEE A.T.S.
(National Univ. Singapore, Singapore, SGP)
,
TROADEC C.
(Inst. Materials Res. and Engineering(IMRE), Agency for Sci., Technol. and Res.(A*STAR), Singapore, SGP)
,
SAEYS M.
(Inst. Materials Res. and Engineering(IMRE), Agency for Sci., Technol. and Res.(A*STAR), Singapore, SGP)
,
SAEYS M.
(Ghent Univ., Ghent, BEL)
,
JOACHIM C.
(Inst. Materials Res. and Engineering(IMRE), Agency for Sci., Technol. and Res.(A*STAR), Singapore, SGP)
,
JOACHIM C.
(CEMES-CNRS, Toulouse, FRA)
,
JOACHIM C.
(National Inst. Materials Sci.(NIMS), Ibaraki, JPN)
資料名:
Surface Science
(Surface Science)
巻:
632
ページ:
L13-L17
発行年:
2015年02月
JST資料番号:
C0129B
ISSN:
0039-6028
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
オランダ (NLD)
言語:
英語 (EN)