文献
J-GLOBAL ID:201502275365081563
整理番号:15A0598437
直流マグネトロンスパッタ法で堆積したガリウムドープ酸化亜鉛膜の構造,電気および光学特性に及ぼすインジウム添加および熱処理の影響
Influence of addition of indium and of post-annealing on structural, electrical and optical properties of gallium-doped zinc oxide thin films deposited by direct-current magnetron sputtering
著者 (8件):
PHAM Duy Phong
(Lab. of Advanced Materials, Univ. of Sci., Vietnam National Univ., HoChiMinh, Viet Nam)
,
PHAM Duy Phong
(Coll. of Information and Communication Engineering, Sungkyunkwan Univ., Suwon 440-746, KOR)
,
NGUYEN Huu Truong
(Lab. of Advanced Materials, Univ. of Sci., Vietnam National Univ., HoChiMinh, Viet Nam)
,
PHAN Bach Thang
(Lab. of Advanced Materials, Univ. of Sci., Vietnam National Univ., HoChiMinh, Viet Nam)
,
PHAN Bach Thang
(Fac. of Materials Sci., Univ. of Sci., Vietnam National Univ., HoChiMinh, Viet Nam)
,
HOANG Van Dung
(Lab. of Advanced Materials, Univ. of Sci., Vietnam National Univ., HoChiMinh, Viet Nam)
,
MAENOSONO Shinya
(School of Materials Sci., Japan Advanced Inst. of Sci. and Technol., 1-1 Asahidai, Nomi, Ishikawa 923-1292, JPN)
,
TRAN Cao Vinh
(Lab. of Advanced Materials, Univ. of Sci., Vietnam National Univ., HoChiMinh, Viet Nam)
資料名:
Thin Solid Films
(Thin Solid Films)
巻:
583
ページ:
201-204
発行年:
2015年05月29日
JST資料番号:
B0899A
ISSN:
0040-6090
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)