文献
J-GLOBAL ID:201502279813098532
整理番号:15A0675233
プレーナHgCdTe中波長赤外線フォトダイオードの動的抵抗に及ぼす表面電場効果
Effect of surface fields on the dynamic resistance of planar HgCdTe mid-wavelength infrared photodiodes
著者 (11件):
HE Kai
(Key Lab. of Infrared Imaging Materials and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
,
ZHOU Song-min
(Key Lab. of Infrared Imaging Materials and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
,
LI Yang
(Graduate School of Information Sci. and Technol., The Univ. of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8656, JPN)
,
WANG Xi
(Key Lab. of Infrared Imaging Materials and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
,
ZHANG Peng
(Key Lab. of Infrared Imaging Materials and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
,
CHEN Yi-yu
(Key Lab. of Infrared Imaging Materials and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
,
XIE Xiao-hui
(Key Lab. of Infrared Imaging Materials and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
,
LIN Chun
(Key Lab. of Infrared Imaging Materials and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
,
YE Zhen-hua
(Key Lab. of Infrared Imaging Materials and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
,
WANG Jian-xin
(Key Lab. of Infrared Imaging Materials and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
,
ZHANG Qin-yao
(Key Lab. of Infrared Imaging Materials and Detectors, Shanghai Inst. of Technical Physics, Chinese Acad. of Sciences ...)
資料名:
Journal of Applied Physics
(Journal of Applied Physics)
巻:
117
号:
20
ページ:
204501-204501-8
発行年:
2015年05月28日
JST資料番号:
C0266A
ISSN:
0021-8979
CODEN:
JAPIAU
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)