文献
J-GLOBAL ID:201502280235077851
整理番号:15A0247248
歯科インプラント材の表面上の室内普遍汚染物の検出のためのFourier変換分光イメージング顕微鏡法(FT-SIM)および走査型ラマン顕微鏡法
Fourier transform spectral imaging microscopy (FT-SIM) and scanning Raman microscopy for the detection of indoor common contaminants on the surface of dental implants
著者 (6件):
LUTIN Anna
(Schulich department of chemistry, Technion - Israel Inst. of Technol., Haifa 32000, ISR)
,
BULATOV Valery
(Schulich department of chemistry, Technion - Israel Inst. of Technol., Haifa 32000, ISR)
,
JADWAT Yusuf
(Periodontology and Oral Medicine, School of Oral Health Sciences, Fac. of Health Sciences, Univ. of Limpopo, Medunsa ...)
,
WOOD Neil H.
(Periodontology and Oral Medicine, School of Oral Health Sciences, Fac. of Health Sciences, Univ. of Limpopo, Medunsa ...)
,
FELLER Liviu
(Periodontology and Oral Medicine, School of Oral Health Sciences, Fac. of Health Sciences, Univ. of Limpopo, Medunsa ...)
,
SCHECHTER Israel
(Schulich department of chemistry, Technion - Israel Inst. of Technol., Haifa 32000, ISR)
資料名:
Talanta
(Talanta)
巻:
134
ページ:
514-523
発行年:
2015年03月01日
JST資料番号:
E0324A
ISSN:
0039-9140
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)