文献
J-GLOBAL ID:201602232778338801
整理番号:16A0388185
4H-SiC p-i-nダイオードにおける順方向劣化に際してのShockley型積層欠陥の成長
Growth of Shockley type stacking faults upon forward degradation in 4H-SiC p-i-n diodes
著者 (16件):
TANAKA Atsushi
(Advanced Power Electronics Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), 16-1 Onogawa ...)
,
MATSUHATA Hirofumi
(Advanced Power Electronics Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), 16-1 Onogawa ...)
,
KAWABATA Naoyuki
(Advanced Power Electronics Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), 16-1 Onogawa ...)
,
MORI Daisuke
(Fuji Electric Co., Ltd., 1 Fuji-cho, Hino-city, Tokyo 191-8502, JPN)
,
INOUE Kei
(Fuji Electric Co., Ltd., 1 Fuji-cho, Hino-city, Tokyo 191-8502, JPN)
,
RYO Mina
(Advanced Power Electronics Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), 16-1 Onogawa ...)
,
FUJIMOTO Takumi
(Advanced Power Electronics Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), 16-1 Onogawa ...)
,
TAWARA Takeshi
(Advanced Power Electronics Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), 16-1 Onogawa ...)
,
MIYAZATO Masaki
(Advanced Power Electronics Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), 16-1 Onogawa ...)
,
MIYAJIMA Masaaki
(Advanced Power Electronics Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), 16-1 Onogawa ...)
,
FUKUDA Kenji
(Advanced Power Electronics Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), 16-1 Onogawa ...)
,
OHTSUKI Akihiro
(Fuji Electric Co., Ltd., 1 Fuji-cho, Hino-city, Tokyo 191-8502, JPN)
,
KATO Tomohisa
(Advanced Power Electronics Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), 16-1 Onogawa ...)
,
TSUCHIDA Hidekazu
(Central Res. Inst. of Electric Power Ind. (CRIEPI), 2-6-1 Nagasaka, Yokosuka, Kanagawa 240-0196, JPN)
,
YONEZAWA Yoshiyuki
(Advanced Power Electronics Res. Center, National Inst. of Advanced Industrial Sci. and Technol. (AIST), 16-1 Onogawa ...)
,
KIMOTO Tsunenobu
(Dep. of Electronic Sci. and Engineering, Kyoto Univ., Katsura, Nishikyo, Kyoto 615-8510, JPN)
資料名:
Journal of Applied Physics
(Journal of Applied Physics)
巻:
119
号:
9
ページ:
095711-095711-9
発行年:
2016年03月07日
JST資料番号:
C0266A
ISSN:
0021-8979
CODEN:
JAPIAU
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)