文献
J-GLOBAL ID:201602235199666756
整理番号:16A0774805
SSRFのためのバンチ-バイ-バンチビーム横方向フィードバックエレクトロニクスの設計と試験【Powered by NICT】
Design and testing of the bunch-by-bunch beam transverse feedback electronics for SSRF
著者 (5件):
Liu Jinxin
(State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, 230026, China)
,
Zhao Lei
(State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, 230026, China)
,
Zhan Linsong
(State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, 230026, China)
,
Liu Shubin
(State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, 230026, China)
,
An Qi
(State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, 230026, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
RT
ページ:
1-3
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)