文献
J-GLOBAL ID:201602246599300096
整理番号:16A0975633
LPDDR4チャネルにおけるウエハレベルAP試験のための信号/パワー完全性を備えた多層プローブカードの設計【Powered by NICT】
Multi-layer probe card design with signal/power integrity for wafer-level AP test in LPDDR4 channel
著者 (10件):
Song Jinwook
(Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea)
,
Kim Jonghoon
(Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea)
,
Park Shinyoung
(Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea)
,
Lee Eunjung
(Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea)
,
Kim Joungho
(Department of Electrical Engineering, Korea Advanced Institute of Science and Technology, Daejeon, South Korea)
,
Park Jeoung Keun
(Wafer Inspection Leading Lab, Will-technology Co., LTD, Suwon, South Korea)
,
Park Jong Hyun
(Wafer Inspection Leading Lab, Will-technology Co., LTD, Suwon, South Korea)
,
Bang Yoon Hee
(Wafer Inspection Leading Lab, Will-technology Co., LTD, Suwon, South Korea)
,
Kim Il
(Wafer Inspection Leading Lab, Will-technology Co., LTD, Suwon, South Korea)
,
Nam Seungki
(Product &Test Engineering Team, System LSI, Semiconductor Biz. Samsung Electronics Co., LTD., Suwon, South Korea)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
EMC
ページ:
547-552
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)