文献
J-GLOBAL ID:201602251625067738
整理番号:16A0657067
モバイル環境におけるRFIを緩和するためのLPDDR界面におけるEMI効果のシミュレーションに基づく解析【Powered by NICT】
Simulation-based analysis on EMI effect in LPDDR interface for mitigating RFI in a mobile environment
著者 (7件):
Kim Seil
(Quality & Reliability Team, S. LSI Business, Samsung Electronics, 1 Samsung-ro, Giheung-gu, Yongin-si, Gyeonggi-do, South Korea)
,
Moon Sungwook
(Design Technology, S. LSI Business, Samsung Electronics, 1 Samsung-ro, Giheung-gu, Yongin-si, Gyeonggi-do, South Korea)
,
Lee Seungbae
(Quality & Reliability Team, S. LSI Business, Samsung Electronics, 1 Samsung-ro, Giheung-gu, Yongin-si, Gyeonggi-do, South Korea)
,
Yi Donny
(Design Technology, S. LSI Business, Samsung Electronics, 1 Samsung-ro, Giheung-gu, Yongin-si, Gyeonggi-do, South Korea)
,
Park Goeun
(Quality & Reliability Team, S. LSI Business, Samsung Electronics, 1 Samsung-ro, Giheung-gu, Yongin-si, Gyeonggi-do, South Korea)
,
Shin Sangchul
(Quality & Reliability Team, S. LSI Business, Samsung Electronics, 1 Samsung-ro, Giheung-gu, Yongin-si, Gyeonggi-do, South Korea)
,
Pae Sangwoo
(Quality & Reliability Team, S. LSI Business, Samsung Electronics, 1 Samsung-ro, Giheung-gu, Yongin-si, Gyeonggi-do, South Korea)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
SPI
ページ:
1-4
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)