文献
J-GLOBAL ID:201602254177821867
整理番号:16A0694644
残響室における積層PCBの吸収断面積測定【Powered by NICT】
Absorption Cross Section measurement of stacked PCBs in a reverberation chamber
著者 (9件):
Parker S. L.
(Department of Electronics, University of York, UK)
,
Flintoft I. D.
(Department of Electronics, University of York, UK)
,
Marvin A. C.
(Department of Electronics, University of York, UK)
,
Dawson J. F.
(Department of Electronics, University of York, UK)
,
Bale S. J.
(Department of Electronics, University of York, UK)
,
Robinson M. P.
(Department of Electronics, University of York, UK)
,
Ming Ye
(Research and Development Center, Huawei Technologies AB, Kista, Sweden)
,
Changyong Wan
(Huawei Industrial Base, Huawei Technologies Co. Ltd., Shenzhen, China)
,
Mengze Zhang
(Huawei Industrial Base, Huawei Technologies Co. Ltd., Shenzhen, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
APEMC
ページ:
991-993
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)