文献
J-GLOBAL ID:201602264310208355
整理番号:16A1285916
温度と注入依存光ルミネセンスイメージングを用いたスワール欠陥研究【Powered by NICT】
Swirl defect investigation using temperature- and injection-dependent photoluminescence imaging
著者 (11件):
Youssef Amanda
(Massachusetts Institute of Technology, Cambridge, Massachusetts, 02139, USA)
,
Schon Jonas
(Fraunhofer Institute for Solar Energy Systems, Heidenhofstras&e 2, D-79110 Freiburg, Germany)
,
Niewelt Tim
(Fraunhofer Institute for Solar Energy Systems, Heidenhofstras&e 2, D-79110 Freiburg, Germany)
,
Mack Sebastian
(Fraunhofer Institute for Solar Energy Systems, Heidenhofstras&e 2, D-79110 Freiburg, Germany)
,
Park Sungeun
(Fraunhofer Institute for Solar Energy Systems, Heidenhofstras&e 2, D-79110 Freiburg, Germany)
,
Nakajima Kazuo
(FUTURE-PV Innovation, Koriyama, Fukushima 963-0215, Japan)
,
Morishita Kohei
(Kyoto University, Yoshida-Honmachi, Sakyo-Ku, Kyoto 606-8501, Japan)
,
Murai Ryota
(FUTURE-PV Innovation, Koriyama, Fukushima 963-0215, Japan)
,
Jensen Mallory A.
(Massachusetts Institute of Technology, Cambridge, Massachusetts, 02139, USA)
,
Buonassisi Tonio
(Massachusetts Institute of Technology, Cambridge, Massachusetts, 02139, USA)
,
Schubert Martin C.
(Fraunhofer Institute for Solar Energy Systems, Heidenhofstras&e 2, D-79110 Freiburg, Germany)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
PVSC
ページ:
1303-1307
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)