文献
J-GLOBAL ID:201602288028041080
整理番号:16A0798442
100nsランダムアクセス時間を持つ65nm技術における1G細胞フローティングゲートNORフラッシュメモリ【Powered by NICT】
A 1G-cell floating-gate NOR flash memory in 65 nm technology with 100 ns random access time
著者 (6件):
Liu Lifang
(Institute of Microelectronics, University of Tsinghua)
,
Wu Dong
(Institute of Microelectronics, University of Tsinghua)
,
Liu Xuemei
(Institute of Microelectronics, University of Tsinghua)
,
Huo Zongliang
(Laboratory of Nano-Fabrication and Novel Devices Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences)
,
Liu Ming
(Laboratory of Nano-Fabrication and Novel Devices Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences)
,
Pan Liyang
(Institute of Microelectronics, University of Tsinghua)
資料名:
Science China. Information Sciences
(Science China. Information Sciences)
巻:
58
号:
4
ページ:
042405-1-042405-8
発行年:
2015年
JST資料番号:
C2579A
ISSN:
1674-733X
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
中国 (CHN)
言語:
英語 (EN)