文献
J-GLOBAL ID:201602292014120434
整理番号:16A1150816
CdTe正孔濃度と寿命への開回路電圧の関係【Powered by NICT】
Relationship of Open-Circuit Voltage to CdTe Hole Concentration and Lifetime
著者 (12件):
Duenow Joel N.
(National Renewable Energy Laboratory, Golden, CO, USA)
,
Burst James M.
(National Renewable Energy Laboratory, Golden, CO, USA)
,
Albin David S.
(National Renewable Energy Laboratory, Golden, CO, USA)
,
Reese Matthew O.
(National Renewable Energy Laboratory, Golden, CO, USA)
,
Jensen Soren A.
(National Renewable Energy Laboratory, Golden, CO, USA)
,
Johnston Steven W.
(National Renewable Energy Laboratory, Golden, CO, USA)
,
Kuciauskas Darius
(National Renewable Energy Laboratory, Golden, CO, USA)
,
Swain Santosh K.
(Center for Materials Research, Washington State University, Pullman, WA, USA)
,
Ablekim Tursun
(Center for Materials Research, Washington State University, Pullman, WA, USA)
,
Lynn Kelvin G.
(Department of Physics, Center for Materials Research, School of Mechanical and Materials Engineering, Washington State University, Pullman, WA, USA)
,
Fahrenbruch Alan L.
(Department of Materials Science and Engineering, Stanford University, Stanford, CA, USA)
,
Metzger Wyatt K.
(National Renewable Energy Laboratory, Golden, CO, USA)
資料名:
IEEE Journal of Photovoltaics
(IEEE Journal of Photovoltaics)
巻:
6
号:
6
ページ:
1641-1644
発行年:
2016年
JST資料番号:
W2305A
ISSN:
2156-3381
CODEN:
IJPEG8
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)