文献
J-GLOBAL ID:201602293977309062
整理番号:15A1126369
Improvement of the off-state breakdown voltage with field plate and low-density drain in AlGaN/GaN high-electron mobility transistors
著者 (8件):
Zhang Peng
(School of Advanced Materials and Nanotechnology, Xidian Univ. Key Lab. of Ministry of Education for Wide Band-Gap ...)
,
Zhao Shenglei
(School of Advanced Materials and Nanotechnology, Xidian Univ. Key Lab. of Ministry of Education for Wide Band-Gap ...)
,
Hou Bin
(School of Advanced Materials and Nanotechnology, Xidian Univ. Key Lab. of Ministry of Education for Wide Band-Gap ...)
,
Wang Chong
(School of Advanced Materials and Nanotechnology, Xidian Univ. Key Lab. of Ministry of Education for Wide Band-Gap ...)
,
Zheng Xuefeng
(School of Advanced Materials and Nanotechnology, Xidian Univ. Key Lab. of Ministry of Education for Wide Band-Gap ...)
,
Ma Xiaohua
(School of Advanced Materials and Nanotechnology, Xidian Univ. Key Lab. of Ministry of Education for Wide Band-Gap ...)
,
Zhang Jincheng
(School of Advanced Materials and Nanotechnology, Xidian Univ. Key Lab. of Ministry of Education for Wide Band-Gap ...)
,
Hao Yue
(School of Advanced Materials and Nanotechnology, Xidian Univ. Key Lab. of Ministry of Education for Wide Band-Gap ...)
資料名:
Chinese Physics B
(Chinese Physics B)
巻:
24
号:
3
ページ:
037304-1-037304-4
発行年:
2015年
JST資料番号:
W1539A
ISSN:
1674-1056
資料種別:
逐次刊行物 (A)
発行国:
中国 (CHN)
言語:
英語 (EN)