文献
J-GLOBAL ID:201702211746926863
整理番号:17A0755341
新鮮:高速TSV試験のための新しい試験結果抽出方式【Powered by NICT】
FRESH: A New Test Result Extraction Scheme for Fast TSV Tests
著者 (3件):
Park Jaeseok
(Department of Electrical and Electronic Engineering, Computer System and Reliable SOC Laboratory, Yonsei University, Seoul, South Korea)
,
Lim Hyunyul
(Department of Electrical and Electronic Engineering, Computer System and Reliable SOC Laboratory, Yonsei University, Seoul, South Korea)
,
Kang Sungho
(Department of Electrical and Electronic Engineering, Computer System and Reliable SOC Laboratory, Yonsei University, Seoul, South Korea)
資料名:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
(IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems)
巻:
36
号:
2
ページ:
336-345
発行年:
2017年
JST資料番号:
B0142C
ISSN:
0278-0070
CODEN:
ITCSDI
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)