文献
J-GLOBAL ID:201702211972836836
整理番号:17A0362505
低地球軌道での宇宙応用における高電力デバイスのための故障率計算法【Powered by NICT】
Failure rate calculation method for high power devices in space applications at low earth orbit
著者 (4件):
Dashdondog Erdenebaatar
(Department of Electrical Engineering and Electronics, Kyushu Institute of Technology, Kitakyushu, Japan)
,
Harada Shohei
(Department of Electrical Engineering and Electronics, Kyushu Institute of Technology, Kitakyushu, Japan)
,
Shiba Yuji
(Department of Electrical Engineering and Electronics, Kyushu Institute of Technology, Kitakyushu, Japan)
,
Omura Ichiro
(Department of Electrical Engineering and Electronics, Kyushu Institute of Technology, Kitakyushu, Japan)
資料名:
Microelectronics Reliability
(Microelectronics Reliability)
巻:
64
ページ:
502-506
発行年:
2016年
JST資料番号:
C0530A
ISSN:
0026-2714
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
イギリス (GBR)
言語:
英語 (EN)