文献
J-GLOBAL ID:201702212687453486
整理番号:17A0369875
トポロジカル絶縁体Bi_2Te_3薄膜の厚さに依存する磁気輸送特性とテラヘルツ応答【Powered by NICT】
Thickness-dependent magnetotransport properties and terahertz response of topological insulator Bi2Te3 thin films
著者 (6件):
Le Phuoc Huu
(Faculty of Basic Sciences, Can Tho University of Medicine and Pharmacy, 179 Nguyen Van Cu Street, Can Tho, Viet Nam)
,
Liu Po-Tsun
(Department of Electrophysics, National Chiao Tung University, Hsinchu 30010 Taiwan)
,
Luo Chih Wei
(Department of Electrophysics, National Chiao Tung University, Hsinchu 30010 Taiwan)
,
Luo Chih Wei
(Taiwan Consortium of Emergent Crystalline Materials, Ministry of Science and Technology, Taipei 10601, Taiwan)
,
Lin Jiunn-Yuan
(Institute of Physics, National Chiao Tung University, Hsinchu 30010, Taiwan)
,
Wu Kaung Hsiung
(Department of Electrophysics, National Chiao Tung University, Hsinchu 30010 Taiwan)
資料名:
Journal of Alloys and Compounds
(Journal of Alloys and Compounds)
巻:
692
ページ:
972-979
発行年:
2017年
JST資料番号:
D0083A
ISSN:
0925-8388
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)