文献
J-GLOBAL ID:201702212794357440
整理番号:17A0379511
データマイニング応用を統合したIoTに触発された半導体信頼性試験システム【Powered by NICT】
An IoT inspired semiconductor Reliability test system integrated with data-mining applications
著者 (8件):
Tang Tyler Junyao
(Quality and Reliability Engineering, Semiconductor Manufacturing International Corporation, Shanghai, China)
,
Chung Andrew
(Quality and Reliability Engineering, Semiconductor Manufacturing International Corporation, Shanghai, China)
,
Zhao Atman
(Quality and Reliability Engineering, Semiconductor Manufacturing International Corporation, Shanghai, China)
,
Kang Randy
(Quality and Reliability Engineering, Semiconductor Manufacturing International Corporation, Shanghai, China)
,
Zhang Mark
(Quality and Reliability Engineering, Semiconductor Manufacturing International Corporation, Shanghai, China)
,
Chien Kary
(Quality and Reliability Engineering, Semiconductor Manufacturing International Corporation, Shanghai, China)
,
Jungang Yang
(Institute of Intelligent Manufacturing and Information Engineering, Shanghai Jiao Tong University, China)
,
Jie Zhang
(Institute of Intelligent Manufacturing and Information Engineering, Shanghai Jiao Tong University, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
CCIOT
ページ:
111-114
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)