文献
J-GLOBAL ID:201702213583121431
整理番号:17A0214180
チャネルパーコレーション展望からの「ランダムデバイス物理」を理解するための新しいアプローチ:統計的シミュレーション,重要な因子と実験結果【Powered by NICT】
New approach for understanding “random device physics” from channel percolation perspectives: Statistical simulations, key factors and experimental results
著者 (10件):
Zhang Zhe
(Key Laboratory of Microelectronic Devices and Circuits (MOE), Institute of Microelectronics, Peking University, Beijing 100871, China)
,
Zhang Zexuan
(Key Laboratory of Microelectronic Devices and Circuits (MOE), Institute of Microelectronics, Peking University, Beijing 100871, China)
,
Wang Runsheng
(Key Laboratory of Microelectronic Devices and Circuits (MOE), Institute of Microelectronics, Peking University, Beijing 100871, China)
,
Jiang Xiaobo
(Key Laboratory of Microelectronic Devices and Circuits (MOE), Institute of Microelectronics, Peking University, Beijing 100871, China)
,
Guo Shaofeng
(Key Laboratory of Microelectronic Devices and Circuits (MOE), Institute of Microelectronics, Peking University, Beijing 100871, China)
,
Wang Yangyuan
(Key Laboratory of Microelectronic Devices and Circuits (MOE), Institute of Microelectronics, Peking University, Beijing 100871, China)
,
Wang Xingsheng
(Synopsys, Glasgow G3 7JT, U.K.)
,
Cheng Binjie
(Synopsys, Glasgow G3 7JT, U.K.)
,
Asenov Asen
(Synopsys, Glasgow G3 7JT, U.K.)
,
Huang Ru
(Key Laboratory of Microelectronic Devices and Circuits (MOE), Institute of Microelectronics, Peking University, Beijing 100871, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
IEDM
ページ:
7.2.1-7.2.4
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)