文献
J-GLOBAL ID:201702213594827515
整理番号:17A0443929
酸化すず薄膜紫外光検出器の性能に及ぼす焼なまし時間の影響【Powered by NICT】
Effect of annealing time on the performance of tin oxide thin films ultraviolet photodetectors
著者 (5件):
Djamil Rechem
(Laboratory of Active Components and Materials, University Larbi Ben M’hidi Oum El Bouaghi, Algeria)
,
Djamil Rechem
(Department of Electrical Engineering, Faculty of Sciences and Applied Sciences, University Larbi Ben M’hidi Oum El Bouaghi, Algeria)
,
Aicha Khial
(Laboratory of Active Components and Materials, University Larbi Ben M’hidi Oum El Bouaghi, Algeria)
,
Souifi Abdelkader
(Institut des Nanotechnologies de Lyon, UMR-CNRS 5270, INSA de Lyon, France)
,
Faycal Djeffal
(LEA, Department of electronics, University of Batna, Batna 05000, Algeria)
資料名:
Thin Solid Films
(Thin Solid Films)
巻:
623
ページ:
1-7
発行年:
2017年
JST資料番号:
B0899A
ISSN:
0040-6090
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)