文献
J-GLOBAL ID:201702214121531110
整理番号:17A1555397
末端結合PDMS/銅界面の剥離挙動:分子動力学研究【Powered by NICT】
Delamination behavior of an end-linked PDMS/copper interface: A molecular dynamics study
著者 (8件):
Wang Wenjia
(School of Mechanical and Electronic Engineering, Guilin University of Electronic Technology, China)
,
Pan Kailin
(School of Mechanical and Electronic Engineering, Guilin University of Electronic Technology, China)
,
Li Tingting
(School of Mechanical and Electronic Engineering, Guilin University of Electronic Technology, China)
,
Han Xufeng
(School of Mechanical and Electronic Engineering, Guilin University of Electronic Technology, China)
,
Cao Weiwu
(School of Mechanical and Electronic Engineering, Guilin University of Electronic Technology, China)
,
Gong Siming
(School of Mechanical and Electronic Engineering, Guilin University of Electronic Technology, China)
,
Wang Wenhui
(School of Mechanical and Electronic Engineering, Guilin University of Electronic Technology, China)
,
Fan Kai
(School of Mechanical and Electronic Engineering, Guilin University of Electronic Technology, China)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
ICEPT
ページ:
1542-1546
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)