文献
J-GLOBAL ID:201702215546906956
整理番号:17A1708201
ポリスチレンコア粒子上でのシリカシェルの分布粗さの定量化のためのツールとしてのTSEMベース輪郭解析【Powered by NICT】
TSEM-based contour analysis as a tool for the quantification of the profile roughness of silica shells on polystyrene core particles
著者 (6件):
Sarma Dominik
(Chemical and Optical Sensing Division 1.9, Bundesanstalt fuer Materialforschung und -pruefung (BAM), Richard-Willstaetter-Strasse 11, 12489 Berlin, Germany)
,
Mielke Johannes
(Surface Analysis and Interfacial Chemistry Division 6.1, Bundesanstalt fuer Materialforschung und -pruefung (BAM), Unter den Eichen 44-46, 12203 Berlin, Germany)
,
Sahre Mario
(Surface Modification and Measurement Technology Division 6.7, Bundesanstalt fuer Materialforschung und -pruefung (BAM), Unter den Eichen 44-46, 12203 Berlin, Germany)
,
Beck Uwe
(Surface Modification and Measurement Technology Division 6.7, Bundesanstalt fuer Materialforschung und -pruefung (BAM), Unter den Eichen 44-46, 12203 Berlin, Germany)
,
Hodoroaba Vasile-Dan
(Surface Analysis and Interfacial Chemistry Division 6.1, Bundesanstalt fuer Materialforschung und -pruefung (BAM), Unter den Eichen 44-46, 12203 Berlin, Germany)
,
Rurack Knut
(Chemical and Optical Sensing Division 1.9, Bundesanstalt fuer Materialforschung und -pruefung (BAM), Richard-Willstaetter-Strasse 11, 12489 Berlin, Germany)
資料名:
Applied Surface Science
(Applied Surface Science)
巻:
426
ページ:
446-455
発行年:
2017年
JST資料番号:
B0707B
ISSN:
0169-4332
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)