文献
J-GLOBAL ID:201702217398021913
整理番号:17A1003225
ダイヤモンドの浅い窒素空孔中心の電荷安定性に及ぼすラジカル曝露窒化表面の影響
Effect of a radical exposure nitridation surface on the charge stability of shallow nitrogen-vacancy centers in diamond
著者 (19件):
KAGEURA Taisuke
(Waseda Univ., Tokyo, JPN)
,
KATO Kanami
(Waseda Univ., Tokyo, JPN)
,
YAMANO Hayate
(Waseda Univ., Tokyo, JPN)
,
SUAEBAH Evi
(Waseda Univ., Tokyo, JPN)
,
KAJIYA Miki
(Waseda Univ., Tokyo, JPN)
,
KAWAI Sora
(Waseda Univ., Tokyo, JPN)
,
INABA Masafumi
(Waseda Univ., Tokyo, JPN)
,
TANII Takashi
(Waseda Univ., Tokyo, JPN)
,
HARUYAMA Moriyoshi
(National Inst. for Quantum and Radiological Sci. and Technol., Gunma, JPN)
,
HARUYAMA Moriyoshi
(Gunma Univ., Gunma, JPN)
,
YAMADA Keisuke
(National Inst. for Quantum and Radiological Sci. and Technol., Gunma, JPN)
,
ONODA Shinobu
(National Inst. for Quantum and Radiological Sci. and Technol., Gunma, JPN)
,
KADA Wataru
(Gunma Univ., Gunma, JPN)
,
HANAIZUMI Osamu
(Gunma Univ., Gunma, JPN)
,
TERAJI Tokuyuki
(National Inst. for Materials Sci., Ibaraki, JPN)
,
ISOYA Junichi
(Univ. Tsukuba, Ibaraki, JPN)
,
KONO Shozo
(Kagami Memorial Res. Inst. for Materials Sci. and Technol., Tokyo, JPN)
,
KAWARADA Hiroshi
(Waseda Univ., Tokyo, JPN)
,
LIST Hide full author
(Kagami Memorial Res. Inst. for Materials Sci. and Technol., Tokyo, JPN)
資料名:
Applied Physics Express
(Applied Physics Express)
巻:
10
号:
5
ページ:
055503.1-055503.4
発行年:
2017年05月
JST資料番号:
F0599C
ISSN:
1882-0778
CODEN:
APEPC4
資料種別:
逐次刊行物 (A)
記事区分:
短報
発行国:
イギリス (GBR)
言語:
英語 (EN)