文献
J-GLOBAL ID:201702219036609060
整理番号:17A0471161
X線光電子分光法(XPS)の焦点におけるC_60クラスタ,ArクラスタとAr~+イオンスパッタリングによって誘起された選択されたZn系腐食生成物の化学的分解【Powered by NICT】
Chemical degradation of selected Zn-based corrosion products induced by C60 cluster, Ar cluster and Ar+ ion sputtering in the focus of X-ray photoelectron spectroscopy (XPS)
著者 (7件):
Steinberger R.
(Christian Doppler Laboratory for Microscopic and Spectroscopic Material Characterization, Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenberger Strasse 69, 4040 Linz, Austria)
,
Sicking J.
(Bayer AG, Engineering & Technology, Applied Physics, Chempark Building E 41, 51368 Leverkusen, Germany)
,
Weise J.
(Institut fuer Experimentelle Physik, TU Bergakademie Freiberg, Leipziger Strasse 23, 09599 Freiberg, Germany)
,
Duchoslav J.
(Christian Doppler Laboratory for Microscopic and Spectroscopic Material Characterization, Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenberger Strasse 69, 4040 Linz, Austria)
,
Greunz T.
(Christian Doppler Laboratory for Microscopic and Spectroscopic Material Characterization, Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenberger Strasse 69, 4040 Linz, Austria)
,
Meyer D.C.
(Institut fuer Experimentelle Physik, TU Bergakademie Freiberg, Leipziger Strasse 23, 09599 Freiberg, Germany)
,
Stifter D.
(Christian Doppler Laboratory for Microscopic and Spectroscopic Material Characterization, Center for Surface and Nanoanalytics, Johannes Kepler University Linz, Altenberger Strasse 69, 4040 Linz, Austria)
資料名:
Applied Surface Science
(Applied Surface Science)
巻:
403
ページ:
15-22
発行年:
2017年
JST資料番号:
B0707B
ISSN:
0169-4332
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)