文献
J-GLOBAL ID:201702219160258517
整理番号:17A1383947
アニーリング圧は非晶質SiO_2/Si基板上のコバルトフェライト薄膜におけるイオン移動を誘導する【Powered by NICT】
Annealing pressure induced ions transfer in Cobalt-Ferrite thin films on amorphous SiO2/Si substrates
著者 (9件):
Huang Shun-Yu
(Department of Physics, National Cheng Kung University, Tainan 70101, Taiwan)
,
Chong Cheong-Wei
(Department of Physics, National Cheng Kung University, Tainan 70101, Taiwan)
,
Chen Pin-Hui
(Department of Physics, National Cheng Kung University, Tainan 70101, Taiwan)
,
Li Hong-Lin
(Department of Physics, National Cheng Kung University, Tainan 70101, Taiwan)
,
Li Min-Kai
(Department of Physics, National Cheng Kung University, Tainan 70101, Taiwan)
,
Li Min-Kai
(NSC Instrument Center at NCKU, Tainan 70101, Taiwan)
,
Huang J.C. Andrew
(Department of Physics, National Cheng Kung University, Tainan 70101, Taiwan)
,
Huang J.C. Andrew
(Advanced Optoelectronic Technology Center (AOTC), National Cheng Kung University, Tainan 70101, Taiwan)
,
Huang J.C. Andrew
(Taiwan Consortium of Emergent Crystalline Materials, Ministry of Science and Technology, Taipei 106, Taiwan)
資料名:
Journal of Magnetism and Magnetic Materials
(Journal of Magnetism and Magnetic Materials)
巻:
441
ページ:
537-541
発行年:
2017年
JST資料番号:
H0644A
ISSN:
0304-8853
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
オランダ (NLD)
言語:
英語 (EN)