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J-GLOBAL ID:201702219664376703
整理番号:17A1646168
FinFET SCR:オンチップESD保護のための設計課題と新しいフィンSCRアプローチ【Powered by NICT】
FinFET SCR: Design challenges and novel fin SCR approaches for on-chip ESD protection
著者 (5件):
Paul Milova
(Advanced Nanoelectronic Device & Circuit Research Group, Department of Electronic Systems Engineering, Indian Institute of Science, Bangalore, 560012 India)
,
Kumar B. Sampath
(Advanced Nanoelectronic Device & Circuit Research Group, Department of Electronic Systems Engineering, Indian Institute of Science, Bangalore, 560012 India)
,
Russ Christian
(Intel Deutschland GmbH, Am Campeon 10-12, 85579, Neubiberg, Germany)
,
Gossner Harald
(Intel Deutschland GmbH, Am Campeon 10-12, 85579, Neubiberg, Germany)
,
Shrivastava Mayank
(Advanced Nanoelectronic Device & Circuit Research Group, Department of Electronic Systems Engineering, Indian Institute of Science, Bangalore, 560012 India)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2017
号:
EOS/ESD
ページ:
1-6
発行年:
2017年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)