文献
J-GLOBAL ID:201702220997384205
整理番号:17A0214160
実験結果とシミュレーションを用いた理解RRAM耐久性,保持および窓縁辺のトレードオフ【Powered by NICT】
Understanding RRAM endurance, retention and window margin trade-off using experimental results and simulations
著者 (21件):
Nail C.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Molas G.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Blaise P.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Piccolboni G.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Sklenard B.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Cagli C.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Bernard M.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Roule A.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Azzaz M.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Vianello E.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Carabasse C.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Berthier R.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Cooper D.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Pelissier C.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Magis T.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Ghibaudo G.
(IMEP LAHC CNRS, Grenoble, France)
,
Vallee C.
(LTM CNRS, Grenoble, France)
,
Bedeau D.
(WD San Jose Research Center, US)
,
Mosendz O.
(WD San Jose Research Center, US)
,
De Salvo B.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
,
Perniola L.
(CEA, LETI, MINATEC Campus, GRENOBLE, France)
資料名:
IEEE Conference Proceedings
(IEEE Conference Proceedings)
巻:
2016
号:
IEDM
ページ:
4.5.1-4.5.4
発行年:
2016年
JST資料番号:
W2441A
資料種別:
会議録 (C)
記事区分:
原著論文
発行国:
アメリカ合衆国 (USA)
言語:
英語 (EN)