文献
J-GLOBAL ID:201702221721754003
整理番号:17A0749540
超臨界レンズ光ラベルフリー顕微鏡検査法:サブ回折分解能と超長作動距離【Powered by NICT】
A Supercritical Lens Optical Label-Free Microscopy: Sub-Diffraction Resolution and Ultra-Long Working Distance
著者 (7件):
Qin Fei
(Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore, 117583, Singapore)
,
Huang Kun
(Institute of Materials Research and Engineering, Agency for Science Technology and Research (A*STAR), 2 Fusionopolis Way, Innovis, #08-03, Singapore, 138634, Singapore)
,
Wu Jianfeng
(Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore, 117583, Singapore)
,
Wu Jianfeng
(Department of Physics, National University of Singapore, 2 Science Drive 3, Singapore, 117542, Singapore)
,
Teng Jinghua
(Institute of Materials Research and Engineering, Agency for Science Technology and Research (A*STAR), 2 Fusionopolis Way, Innovis, #08-03, Singapore, 138634, Singapore)
,
Qiu Cheng-Wei
(Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore, 117583, Singapore)
,
Hong Minghui
(Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore, 117583, Singapore)
資料名:
Advanced Materials
(Advanced Materials)
巻:
29
号:
8
ページ:
ROMBUNNO.201602721
発行年:
2017年
JST資料番号:
W0001A
ISSN:
0935-9648
CODEN:
ADVMEW
資料種別:
逐次刊行物 (A)
記事区分:
原著論文
発行国:
ドイツ (DEU)
言語:
英語 (EN)